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Wednesday, April 22 • 8:30am - 10:30am
Methods of Data Analysis on Scanning Electron Microscopy Images of Synthesized Silver Nanowires

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Scanning electron microscopy (SEM) images of silver nanowires synthesized through ferroelectric lithography are analyzed in order to correlate physical aspects of the nanowires to their growth conditions. In ferroelectric lithography silver is preferentially photo reduced at the 180 degree domain boundaries of lithium niobate substrates. A method of image analysis is developed to acquire quantitative data to test the repeatability of obtaining certain wire properties for given deposition parameters. Size, shape, spacing, orientation, and linear density of the nanoparticles making up the wires are quantitatively measured. The spatial distribution of wires and nanoparticles on the ferroelectric substrate as a function deposition times is also studied. Theoretical models and results of computational analysis on the dynamics of the particles during the deposition process are compared to experimental findings of this work.


Wednesday April 22, 2015 8:30am - 10:30am PDT
Wilma Sherrill Center Concourse